OMTEC 2012 SmartInspectionStation™ Demo and "Choose All Three" Presentation - Level 3 Inspection

OMTEC 2012 SmartInspectionStation™ Demo and “Choose All Three” Presentation

Meet us at OMTEC, Booth #831-833, June 13-14, 2012
Register to attend.
Presented by:
Bill Greene
Chief Executive Officer
Level 3 Inspection LLC

Price, Quality, Speed: Choose All Three

Thursday, June 14, 2012, 10:00 a.m. – 10:45 a.m.
Orthopaedic Manufacturing & Technology Exposition & Conference
Donald E. Stephens Convention Center, Rosemont, Illinois

Participants will learn about the advantages of Computer Aided Inspection for orthopaedic devices:

  • Make better parts faster, with fewer iterations, greater confidence and lower cost
  • SPC tracking and trending of dimensions to reduce sampling rates
  • Trim 30% from new product time-to-market (TTM), saving millions of dollars
  • Reduce legal exposure by avoiding expensive product performance liability problems

Witness the Power of the SmartInspectionSystem™!

The SiS™ is an easy-to-use fully-automated Structured Light Metrology (SLM) and Computer Aided Inspection (CAI) system that orthopaedic and other precision manufacturers can install practically anywhere in their operations.

This patent-pending system uses SLM in tandem with a programmable part positioner and Geomagic Qualify™ to digitize the surfaces of orthopaedic implants and other precision manufactured parts, automatically generating full PDF inspection reports in mere minutes, with minimal operator input and personnel training.

The SiS™ is highly configurable, offering scanning resolutions of 4, 5, and 11 (or more) megapixels, with measuring volumes ranging from 50-380mm (or bigger) to generate very high scan data density as needed per part, feature, and tolerance.

Come and see the SiS™ in operation at OMTEC Booth #831-833, June 13-14, 2012.

Register to attend.

Copyright © 2012 Level 3 Inspection LLC, All rights reserved.

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