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Presented by:
Bill Greene
Chief Executive Officer
Level 3 Inspection LLC
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Price, Quality, Speed: Choose All Three
Thursday, June 14, 2012, 10:00 a.m. – 10:45 a.m.
Orthopaedic Manufacturing & Technology Exposition & Conference
Donald E. Stephens Convention Center, Rosemont, Illinois
Participants will learn about the advantages of Computer Aided Inspection for orthopaedic devices:
- Make better parts faster, with fewer iterations, greater confidence and lower cost
- SPC tracking and trending of dimensions to reduce sampling rates
- Trim 30% from new product time-to-market (TTM), saving millions of dollars
- Reduce legal exposure by avoiding expensive product performance liability problems
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Witness the Power of the SmartInspectionSystem™!
 The SiS™ is an easy-to-use fully-automated Structured Light Metrology (SLM) and Computer Aided Inspection (CAI) system that orthopaedic and other precision manufacturers can install practically anywhere in their operations.
This patent-pending system uses SLM in tandem with a programmable part positioner and Geomagic Qualify™ to digitize the surfaces of orthopaedic implants and other precision manufactured parts, automatically generating full PDF inspection reports in mere minutes, with minimal operator input and personnel training.
The SiS™ is highly configurable, offering scanning resolutions of 4, 5, and 11 (or more) megapixels, with measuring volumes ranging from 50-380mm (or bigger) to generate very high scan data density as needed per part, feature, and tolerance.
Come and see the SiS™ in operation at OMTEC Booth #831-833, June 13-14, 2012.
Register to attend.
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Copyright © 2012 Level 3 Inspection LLC, All rights reserved.
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